| 34-ID-E X-ray Micro-Diffraction Facility Publications
A. Lee,
W. Liu, C. Ho, K. Subramanian, "Synchrotron x-ray microscopy studies on
electromigration of a two-phase material", J. Appl. Phys.,
102, 053507 (2007).
C. Ho, A. Lee, K. Subramanian, W. Liu, "Early stage of material movements in eutectic
SnPb solder joint undergoing current stressing at
150 C",
Appl. Phys. Lett., 91, 021906 (2007).
B. C. Larson, Anter El-Azab, Wenge Yang, J. Z. Tischler, Wenjun Liu, and G. E. Ice, "Experimental characterization of the mesoscale dislocation density tensor", Philosophical Magazine, 87, 1327-1347 (2007).
J.-S. Chung, S. Isa, V. Greene, O. Broadwater, W. Liu, and G.E. Ice, "Multiple differential-aperture microscopy", Nucl. Instrum. Methods A 582 (1), 212-214 (2007).
G. E. Ice, "Reflective optics for microdiffraction" Nucl. Instrum. Methods A 582 (1), 129-131 (2007).
R. I. Barabash, G. E. Ice, C. Roder, J. Budai, W. Liu, S. Figge, S. Einfeldt, D. Hommel, and R. F. Davis, "Characterization of growth defects in thin GaN layers with X-ray microbeam", physica status solidi (b), 244, 1735-1742 (2007).
C. Rau, W. Liu, "Cone-beam imaging with sub-100 nm focal-sized Kirkpatrick–Baez mirrors," Nucl. Instrum. Methods A 582 (1), 132-134 (2007).
E. D. Specht, A. Goyal, and W. Liu, "Local epitaxy of YBa2Cu3Ox on polycrystalline Ni measured by x-ray microdiffraction", Journal of Materials Research, 22, 664-674 (2007).
C. Rau, V. Crecea, W. Liu, C. -P. Richter, K. M. Peterson, P. R. Jemian, U. Neuhausler, G. Schneider, X. Yu, P. V. Braun, T. -C. Chiang, I. K. Robinson, "Synchrotron-based imaging and tomography with hard X-rays", Nuclear Instruments and Methods in Physics Research B, 261, 850¨C854 (2007).
O.M. Barabash, R.I. Barabash, G.E. Ice, S.A. David, Z. Feng, J. Horton, "X-ray MicroBeam Characterization of the Near Surface Nanostructured Layer in Ti after Friction Stir Processing," Rev. Adv. Mater. Sci. 15 (1), 49-55 (2007).
G.E. Ice, R.I. Barabash, "Chapter 79 White Beam Microdiffraction and Dislocations Gradients," Dislocations in Solids, F.R.N. Nabarro, J.P. Hirth, eds., Elsevier, 2007, 499 - 601.
Gang Chen, Dileep Singh, Osman Eryilmaz, Jules Routbort, Bennett C. Larson, Wenjun Liu, "Depth-resolved residual strain in MoN/Mo nanocrystalline films", Applied Physics Letters, 89, 172104,(2006).
Lyle E. Levine, Bennett C. Larson, Wenge Yang, Michael E. Kassner, Jonathan Z. Tischler, Michael A. Delos-Reyes, Richard J. Fields, and Wenjun Liu, "X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper", Nature Materials, 5, 619-622, (2006).
Hael Mughrabi, Tamas Ungar, "X-ray diffraction - Close up on crystal plasticity", Nature Materials, 5, 601-602, (2006).
R. I. Barabash, G. E. Ice, W. Liu, C. Roder, S. Figge, S. Einfeldt, D. Hommel, T. M. Katona, J. S. Speck, S. P. DenBaars, R. F. Davis, "Mapping misorientation and crystallographic tilt in GaN layers via polychromatic microdiffraction",
physica status solidi (b), 243, 1508-1513, (2006).
R. I. Barabash, C. Roder, G. E. Ice, S. Einfeldt, J. D. Budai, O. M. Barabash, S. Figge S, D. Hommel, " Spatially resolved distribution of dislocations and crystallographic tilts in GaN layers grown on Si(111) substrates by maskless cantilever epitaxy", Journal of Applied Physics, 100, 053103, ( 2006 ).
O. M. Barabash, R. I. Barabash, S. A. David, G. E. Ice, "Residual Stresses, Thermomechanical Behavior and Interfaces in the Weld Joint of Ni-based Superalloys",
Advanced Engineering Materials, 8, 202-205, (2006).
R. I. Barabash, O. M. Barabash, G. E. Ice, C. Roder, S. Figge, S. Einfeldt, D. Hommel, T. M. Katona, J. S. Speck, S. P. DenBaars, R. F. Davis, "Characterization of crystallographic properties and defects via X-ray microdiffraction in GaN (0001) layers",
physica status solidi (a), 203, 142-148, (2006).
G. E. Ice, J. W. L. Pang, R. I. Barabash, Y. Puzyrev, "Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction", Scripta Materialia, 55, 57-62, (2006).
G. E. Ice, R. I. Barabash, W. Liu, "Diffuse X-ray scattering from tiny sample volumes", Zeitschrift fur Kristallographie, 220, 1076-1081, (2005).
Wenjun Liu, Gene E. Ice, Jonathan Z. Tischler, Ali Khounsary, Chian Liu, Lahsen Assoufid, and Albert T. Macrander, "Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe",
Rev. Sci. Instrum., 76, 113701 (2005).
Gene E. Ice, Przemyslaw Dera, Wenjun Liu, Ho-kwang Mao, "Adapting polychromatic X-ray microdiffraction techniques to high-pressure research: energy scan approach," J. Synchrotron Rad., 12, 608-617 (2005).
R. L. Newton, J. L. Davidson, G. E. Ice, and W. Liu, "Synchrotron X-ray microdiffraction analysis of proton irradiated polycrystalline diamond films", Diamond & Related Materials, 14, 1588-1591, (2005).
G. E. Ice, R. I. Barabash, F. J. Walker, "Characterization of Nano and Mesoscale Deformation Structures with Intense X-ray Synchrotron Sources," Compos. Sci. Tech. 36, 271-277 (2005). R. I. Barabash, G. E. Ice, W. Liu, S. Einfeldt, D. Hommel, A. M. Roskovski, R. F. Davis, "White X-ray Microbeam Analysis of Strain and Crystallographic Tilt in GaN Layers Grown by Maskless Pendeoepitaxy," Phys. Status Solidi. a. 202 (5), April, 732-783 (2005). Wenjun Liu, Gene E. Ice, Bennett C. Larson, Wenge Yang, Jonathan Z. Tischler, "Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy," Ultramicroscopy 103 (3), June, 199-204 (2005). G. E. Ice, B. C. Larson, W. Yang, J. D. Budai, J. Z. Tischler, J. W. L. Pang, R. I. Barabash, W. Liu, "Polychromatic X-ray Microdiffraction Studies of Mesoscale Structure and Dynamics," J. Synchrotron Rad. 12, December, 155-162 (2005). R. I. Barabash, G. E. Ice, W. Liu, S. Einfeldt, A. M. Roskovski, R. F. Davis, "Local Strain, Defects and Crystallographic Tilt in GaN(0001) Layers Grown by Maskless Pendeo-epitaxy from X-ray Microdiffraction," J. Appl. Phys. 97, 013504-1-013504-5 (2005). R. I. Barabash, G. E. Ice, N. Tamura, B. C. Valek, J. C. Bravman, and J. R. Patel, White Beam Analysis of Coupling Between Precipitation and Plastic Deformation During Electromigration in a Passivated Al (0.5 wt% Cu) Interconnect, Metall. Phys. Advanced Tecknol.. 27(1), (2005) pp. 75-94. G. E. Ice, B. C. Larson, J. Z. Tischler, W. Liu, and W. Yang, X-ray Microbeam Measurements of Subgrain Stress Distributions in Polycrystalline Materials, Materials Science and Engineering A 399 (2005) 43-48. G. E. Ice, R. I. Barabash, and J.W.L. Pang, Polychromatic X-ray Micodiffraction Characterization of Local Crystallographic Structure and Defect Distributions, Encyclopedia of Materials: Science and Technology Updates (2005) pp. 1-15. R. I. Barabash and G. E. Ice, Microdiffraction Analysis of Hierarchical Dislocation Organization, Encyclopedia of Materials: Science and Technology Updates, (2005) pp. 1-18. R. I. Barabash, G. E. Ice, and J.W.L. Pang, Gradients of Geometrically Necessary Dislocations from White Beam Microdiffraction, Materials Science and Engineering. A 400-401 (2005) 125-131. W. Yang, B. Larson, G. Pharr, G. Ice, J. Budai, J. Tischler, W. Liu, "Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy," J. Mater. Res. 19 (1), January, 66-72 (2004). Gene Ice, Bennett Larson, "Three-Dimensional X-Ray Structural Microscopy Using Polychromatic Microbeams," MRS Bull. 29, March, 170-176 (2004). Bennett C. Larson, Bruno Lengeler, "High-Resolution Three-Dimensional X-Ray Microscopy," MRS Bull. 29, March, 152-155 (2004). L. E. Moyer, G. S. Cargill, W. Yang, B. C. Larson, G. E. Ice, "X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films," MRS Bull. 795, March, U1.71-U1.7.5 (2004). Wenjun Liu, Gene Ice, Bennet C. Larson, Wenge Yang, Jonathan Z. Tischler, John D. Budai, "The three-dimensional X-ray crystal microscope: A new tool for materials characterization," Metall. Mater. Trans. A 35 (7), July, 1963-1967 (2004). O. M. Barabash, J. A. Horton, S. S. Babu, J. M. Vitek, S. A. David, J. W. Park, G. E. Ice, R. I. Barabash, "Evolution of dislocation structure in the heat affected zone of a nickel-based single crystal," J. Appl. Phys. 96 (7), October, 3673-3679 (2004). R . I. Barabash, G. E. Ice, J. Pang, W. Liu, "Characterization of the Dislocation Density Tensor with White Beam Diffraction," TMS Lett. 1 (1), 13-14 (2004). R. I. Barabash, N. Tamura, B. C. Valek, J. C. Bravman, R. Spolenak, G. E. Ice, J. R. Patel, "Coupling Between Precipitation and Plastic Deformation During Electromigration in a Passivated Al (0.5wt%Cu) Interconnect” in Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics," Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, . R. J. Carter, C. S. Hau-Riege, G. M. Kloster, T.-M. Lu, S. E. Schulz, eds., 812, MRS (2004), F7.4.1 - 7.4. John D. Budai, Wenge Yang, Bennett C. Larson, Jonathan Z. Tischler, Wenjun Liu, Gene E. Ice, "2D and 3D X-Ray Structural Microscopy Using Submicron-Resolution Laue Microdiffraction," Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, S. R. Bhatia, P. G. Khalifah, D. Pochan, P. Radaelli, eds., 840, Materials Research Society (2004), Q7.1.1 - Q7.1.6. J. D. Budai, W. Yang, B. C. Larson, J. Z. Tischler, W. Liu, H. Weiland, G. E. Ice, "Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum," Mater. Sci. Forum 467-470, 1373-1378 (2004). G.E. Ice, R. Barabash, "Polychromatic X-Ray Microdiffraction Characterization of Local Cyrstallographic Microstructure Evolution in 3D," Proceedings of the 25th Symposium on Materials Science: Evolution of Deformation Microstructures in 3D, C. Gundlach, K. Haldrup, N. Hansen, X. Huang, D. Juul Jensen, T. Letters, Z. J. Lui, S. F. Nielsen, W. Pantelon, J. A. Wert, G. Winther, eds., Riso National Laboratory (2004), 351 - 356. G. E. Ice, R. I. Barabash, J. W. L. Pang, "Evolution of Polar and Dipolar Dislocation Density From Polychromatic Microdiffraction," 2004 Fall Meeting Proceedings, Surita R. Bhatia, Peter G. Khalifah, Darrin J. Pochan, Paolo G. Radaelli, eds., 840, Material Research Society (2004), Q 7.8. G. E. Ice, E.D. Specht, J. Z. Tischler, A. M. Khousary, L. Assoufid, C. Liu, "At the Limit of Nondispersive Micron and Nano Focusing Optics," SPIE Proceedings, 5347, SPIE (2004), 1 - 8. Milo Kral, Gene E. Ice, Rob Rosenberg, Mike Uchic, "3D Reconstruction of Microstructures," ASM International Metallography and Microstructures Handbook, Volume 9, George Vander Voort, eds., ASM Press, 2004, 448 - 467. B. C. Larson, W. Yang, J. Z. Tischler, G. E. Ice, J. D. Budai, W. Liu, H. Weiland, "Micron-resolution 3-D measurement of local orientations near a grain-boundary in plane-strained aluminum using X-ray microbeams," Int. J. Plasticity 20, 543-560 (2004). J. W. L. Pang, R. I. Barabash, W. Liu, G .E. Ice, "Determination of Deformation Inhomogeneity in Polycrystalline Ni under Uniaxial Tension with 3D X-ray Microscope," TMS Lett. 1, 5-6 (2004). Ian Robinson, Jianwei Miao, "Dimensional X-ray Diffraction Microscopy," MRS Bull. 29, 177 -181 (2004). W. Yang, B. C. Larson, J. Z. Tischler, G. E. Ice, J. D. Budai, W. Liu, "Differential-aperture x-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain," Micron 35, 431-439 (2004). R. I. Barabash, G. E. Ice, F. J. Walker, "Quantitative microdiffraction from deformed crystals with unpaired dislocations and dislocation walls," J. Appl. Phys. 93 (3), February, 1457-1464 (2003). I. K. Robinson, C. A. Kenney-Benson, I. A. Vartanyants, "Sources of decoherence in beamline optics," Physica B 336, February, 56-62 (2003). Wenge Yang, B. C. Larson, G. E. Ice, J. Z. Tischler, J. D. Budai, K.-S. Chung, W. P. Lowe, "Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending," Appl. Phys. Lett. 82 (22), June, 3856-3858 (2003). J. D. Budai, W. Yang, N. Tamura, J.-S. Chung, J. Z. Tischler, B. Larson, G. E. Ice, C. Park, D. P. Norton, "X-ray microdiffraction study of growth modes and crystallography tilts in oxide films on metal substrates," Nat. Mater. 2 (7), July, 487-492 (2003). Chian Liu, R. Conley, L. Assoufid, A. T. Macrander, G. E. Ice, J. Z. Tischler, K. Zhang, "Profile coatings and their applications," J. Vac. Sci. Technol. A 21 (4), July, 1579-1584 (2003). C. Liu, L. Assoufid, R. Conley, A. T. Macrander, G. E. Ice, J. Z. Tischler, "Profile coating and its application for Kirkpatrick-Baez mirrors," Opt. Eng. 42 (12), December, 3622-3628 (2003). O. M. Barabash, S. Babu, S. David, J. Vitek, R. I. Barabash, "Plastic Deformation in the Heat Affected Zone During Spot Welding of a Single Crystal Nickel-based Superalloy," J. Appl. Phys. 93, 738-742 (2003). R. I. Barabash, G. E. Ice, N. Tamura, B. C. Valek, J. C. Bravman, R. Spolenak, J. R. Patel, "Spatially Resolved Characterization of Electromigration-Induced Plastic Deformation in Al (0.5wt% Cu) Interconnect," Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures, D. A. Bonnell, J. Piqueras, A. P. Shreve, F. Zypman, eds., 738, Mat. Res. Soc (2003), G.13.1.1 - G.13.1.6. R. I. Barabash, N. Tamura, B. C. Valek, J. C. Bravman, R. Spolenak, G. E. Ice, R. Patel, "Quantitative Characterization of Dislocation Structure Coupled with Electromigration in a Passivated Al (0.5wt% Cu) Interconnects," Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, A. McKerrow, J.Leu, O. Kraft,T. Kikkawa, eds., 766, Mat. Res. Soc. (2003), E1.2.1 - E1.2.8. G. Cargill, L. Moyer, W. Yang, B. Larson, G. Ice, "X-ray Microbeam Strain Measurements in Polycrystalline Films," Mater. Sci. Forum 426-432, 3945-3950 (2003). G. Ice, R. I. Barabash, "Multiscale Dislocation Ensembles from Microdiffraction," Proceedings of the Tenth International Symposium on Plasticity, A. Khan, eds., Neat Press (2003), 277 - 279. G. E. Ice, R. I. Barabash, J. Pang, "Microdiffraction Experiments and Modeling for Analyzing Multiscale Dislocation Ensembles in Materials," Mat. Res. Soc. Symp. Proc., 779, Materials Research Society (2003), 237 - 243. G. E. Ice, B. C. Larson, "Submicron and Nanoscale X-ray Measurements of 3D Strain Tensor Distributions," Proceedings of the 2003 SEM Annual Conf. and Exposition on Experimental and Applied Mechanics, Talk 302, (2003). G. E. Ice, W. Liu, B. C. Larson, F. J. Walker, "Application of the 3D X-ray Crystal Microscope to Study Meoscale Structure of Materials," Mat Res. Soc. Symp. Proc., 779, Mat Res. Soc. (2003), 213 - 2115. B. C. Larson, W. Yang, G. E. Ice, J. Z. Tischler, J. D. Budai, "Micron Resolution Study of Plastic Deformation Microstructure in Nanoindented Single Crystal copper using 3D X-ray Structural Microscopy," Proceedings of the Tenth International Symposium on Plasticity, A. Khan, eds., Neat Press (2003), 283 - 285. I. A. Vartanyants, I. K. Robinson, "Imaging of quantum array structures with coherent and partially coherent diffraction," J. Synchrotron Rad. 10, 409-415 (2003). Wenge Yang, B. C. Larson, G. M. Pharr, G. E. Ice, J. G. Swadener, J. D. Budai, J. Z. Tischler, Wejun Liu, "Deformation Microstructure under Nanoindentations in Cu Using 3D X-ray Structural Microscopy," Symposium Y, Surface Engineering 2002--Synthesis, Characterization and Applications, A. Kumar, W. J. Meng, Y-T. Cheng, J. Zabinski, G. L. Doll, S. Veprek, eds., 750, Materials Research Society (2003), Y8.26.1 - Y8.26.6. Wenge Yang, B.C. Larson, G.M. Pharr, G.E. Ice, J.Z. Tischler, J.D. Budai, Wenjun Liu, "X-ray Microbeam Investigation of Deformation Microstructure in Microindented Cu," MRS Bull. 779, W5.34.1-W5.34.6 (2003). B. C. Larson, Wenge Yang, G. E. Ice, J. D. Budai, J. Z. Tischler, "Three-dimensional x-ray structural microscopy with submicrometre resolution," Nature 415, February, 887-890 (2002). G. S. Cargill III, "Extra dimension with X-rays," Nature 415 (21), February, 844-845 (2002). R. I. Barabash, G. E. Ice, B. C. Larson, Wenge Yang, "Application of white x-ray microbeams for the analysis of dislocation structures," Rev. Sci. Instrum. 73 (3), March, 1652-1654 (2002). G E. Ice, R. Barabash, F. J. Walker, B. C. Larson, "Characterization of Welds with the 3D X-ray Crystal Microscope," Joining of Advanced and Specialty Materials, T. J. Lienert, W. Tillmann, M. Singh, eds., ASM International, July (2002), 65 - 69. R .I. Barabash, G. E. Ice, B. C. Larson, W. Yang, "Local Dislocation Structure from Laue Diffraction," From Proteins to semiconductors: Beyond the average structure, S. J. L. Billinge, M. F. Thorpe, eds., KLuwer Academic/Plenum Press, 2002, 49 - 66. R. I. Barabash, G. E. Ice, F .J. Walker, "Modeling and Numerical Simulations of Microdiffraction From Deformed Crystals," Modeling and Numerical Simulations of Materials Behavior and Evolution, V. Tikare, E. A. Olevsky, A. Zavaliangos, eds., 731, Mat. Res. Soc. (2002), 89 - 95. G. E. Ice, F. J. Walker, B.C. Larson, J.-S. Chung, S. A. David, E. K. Ohriner, "Quantitative Three-dimensional X-ray Microprobe Measurements of Plastic and Elastic Deformation in Welds," Trends in Welding Research, S. David, T. DobRoy, J. C. Lippold, H. B. Smartt, J. M. Vitek, eds., ASM (2002), 873 - 877. W. Yun, G. E. Ice, "X-ray Microbeam and Microscopy Techniques with Hard X-rays," Third-Generation Hard X-Ray Synchrotron Radiation Sources: Source Properties, Optics, and Experimental Techniques, D. Mills, eds., John Wiley and Sons, 2002. G. E. Ice, J. -S. Chung, J. Z. Tischler, A. Lunt, and L. Assoufid, “Elliptical X-ray microprobe mirrors by differential deposition”, Rev. Sci. Instrum. 71, 2635 (2000).
G. E. Ice, J. -S. Chung, W. Lowe, E. Williams, and J. Edelman, “Small-displacement monochromator for microdiffraction experiments”, Rev. Sci. Instrum. 71, 2001 (2000).
Curtis A. Benson, Ian K. Robinson, "Beam Splitting Mirror for Advanced Photon Source Sector 34," Synchrotron Radiation Instrumentation, Piero Pianetta, John Arthur, Sean Brennan, eds., 521, American Institute of Physics, May (2000), 230 - 233.
J. -S. Chung and G. E. Ice, “Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams”, J. Appl. Phys. 86, 5249-5255 (1999).
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