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UNICAT 34-ID-E X-ray Micro-Diffraction Facility

Beamline Phone Number: (630) 252-1834

Three Dimensional Deformation Microstructure Measurement Under Indents Using Submicron Resolution X-Ray Structural Microscopy, (APS User Meeting 2005)
W. Yang, B. C. Larson, G. M. Pharr, J. Z. Tischler, G. E. Ice, J. D. Budai, and W. Liu

Nondispersive Hard X-ray K-B Focusing Below 100 nm, (APS User Meeting 2005)
Wenjun Liu, Gene E. Ice, Jonathan Z. Tischler, B. C. Larson, P. Zschack, A. Khounsary, C. Liu, L. Assoufid, R. Divan, and A. Macrander

Development of Submicron Resolution 2D and 3D X-Ray Structural Microscopy, (APS User Meeting 2004)
B. C. Larson, W. Yang, J. D. Budai, J. Z. Tischler, G. E. Ice, and W. Liu

3D X-ray Diffraction Microscopy of Grain Boundaries, (APS User Meeting 2003)
Wenjun Liu, Gene E. Ice, Wenge Yang, Jon Z. Tischler, and Bennett C. Larson

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This page last modified: 2005-05-18 3:14 PM